Fig. 2: Broadband reconstruction of volumetric intensity patterns using the beam array with longitudinally varying intensity profiles and constant polarization.

The transverse intensity distributions of a 5 × 5 beam array forming sequential letters (“O,” “P,” “T,” “I,” “C,” “S”) along the z-axis, ranging from z = 0.25 mm to z = 2.75 mm. The top row refers to the simulated transverse intensity distributions of the array at the designed axial locations. The second to fifth rows refer to the experimentally measured results of the corresponding transverse intensity distributions under illumination at wavelengths of 633, 580, 532, and 450 nm, respectively. Scale bars: 30 μm. All patterns exhibit high contrast, uniformity, and broadband consistency. The abbreviation “Sim” has the full name of “Simulation”