Fig. 1: Structure and resistive switching (RS) characteristics of an electrochemical metallization (ECM) device with a single-crystalline CrPS4 electrolyte. | NPG Asia Materials

Fig. 1: Structure and resistive switching (RS) characteristics of an electrochemical metallization (ECM) device with a single-crystalline CrPS4 electrolyte.

From: Understanding filamentary growth and rupture by Ag ion migration through single-crystalline 2D layered CrPS4

Fig. 1

a schematic diagram and b cross-sectional transmission electron microscopy (TEM) image. c RS characteristics of an ECM device with a single-crystalline CrPS4 electrolyte. d TEM image of a single-crystalline CrPS4 flake. The inset of (d) shows its fast Fourier transform pattern.

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