Fig. 2: Transmission electron microscopy (TEM) and energy-dispersive X-ray spectroscopy (EDS) results of Au/Ag/CrPS4/Au devices. | NPG Asia Materials

Fig. 2: Transmission electron microscopy (TEM) and energy-dispersive X-ray spectroscopy (EDS) results of Au/Ag/CrPS4/Au devices.

From: Understanding filamentary growth and rupture by Ag ion migration through single-crystalline 2D layered CrPS4

Fig. 2

High-angle annular dark-field scanning TEM (HAADF STEM) images and EDS mapping images of the Au/Ag/CrPS4/Au devices in the a initial state, b low-resistance state, and c high-resistance state. d EDS line profiles showing the compositional changes through the thickness direction of the Au/Ag/CrPS4/Au devices.

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