Fig. 3: Microstructure of the conductive filament and single-crystalline CrPS4. | NPG Asia Materials

Fig. 3: Microstructure of the conductive filament and single-crystalline CrPS4.

From: Understanding filamentary growth and rupture by Ag ion migration through single-crystalline 2D layered CrPS4

Fig. 3

a Scanning transmission electron microscopy (STEM) image of the CrPS4 layer in the low-resistance state (LRS). b Magnified STEM image and c energy-dispersive X-ray spectroscopy mapping image of Ag atoms, obtained from the area marked by the dashed red rectangle in (a). High-resolution transmission electron microscopy (HRTEM) images of CrPS4 layers in the d initial state, e LRS, and f high-resistance state. The insets of (d–f) show the corresponding fast Fourier transform patterns.

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