Fig. 4: Hierarchical fracture behavior in the SLM Ag-Cu-Ge alloy.
From: Premature failure of an additively manufactured material
SEM micrographs showing the fracture surface, b, c dimples (in Ag equiaxed grains) and cleavage (in columnar grains) features. d, e SEM micrographs of fractured samples after polishing showing that cracks propagated along the grain boundaries and longitudinal structures. f, g SEM micrographs showing external defects (pores and unmelted particles). h, i TEM micrographs showing internal defects (dislocations, SFs and twins). j Schematic illustration depicting crack initiation at external defects and crack propagation along internal defects.
