Table 1 Characterization methods of semiconductor magic-sized clusters.

Optics		Structure		Mass		Size/Morphology		Composition
Methods	Examples	Methods	Examples	Methods	Examples	Methods	Examples	Methods	Examples
Steady-state absorption	InP^11,45 InAs¹² CdS¹²³ CdSe¹²⁴ CdTe¹²⁵ Cd₃P₂¹²⁶ Cd₃As₂¹²⁷ ZnSe³⁶ ZnTe¹²⁸ PbSe³³ Ag₂S⁵⁵	SCXRD	InP⁴⁵ CdSe^39,129	MALDI-TOF	InP¹³ CdS²⁸ CdSe¹³⁰ CdZnSe^93,131	TEM	InP^11,40 CdS¹³² CdSe¹³³ Cd₃P₂¹²⁶	ICP	InP^11,134 CdS⁵⁹
Steady-state PL		pXRD	InP^11,12,71 CdS^11,50 CdSe^59,135 ZnTe⁷⁷			STEM	CdSe⁵⁷	EDS	InP^11,58 CdSe⁹⁴ Cd₃P₂¹²⁶
		Raman	InP^11,71 CdS⁵⁰ CdSe⁶⁶	ESI-MS	CdS⁵³ CdSe¹³⁶ CdTe³⁰	SAXS	CdSe¹³⁷ CdTe³⁰ CdTeSe⁴⁰	RBS	CdSe⁶⁰
Transient absorption	InP¹¹ CdSe⁹² ZnTe⁷⁷	PDF	InP¹⁰ CdS⁵⁰ CdSe³⁹					TGA	CdS⁵⁹
Transient PL	InP¹¹ CdSe⁸¹ ZnTe⁹⁸	EXAFS	CdS⁶⁷ CdSe¹³⁷	LDI-MS	CdSe^54,138	Surface ligand		DFT
		XANES	CdSe⁴⁹			Methods	Examples	Examples
PLE	InP¹¹ CdSe^81,135 CdTe¹³⁹ ZnTe³⁹	XPS	InP¹¹ CdS⁵⁰ CdSe¹⁴⁰			NMR	InP^11,58,76 CdSe⁵¹	InP⁶² CdSe^61,141 ZnS¹⁴² PbS¹⁴³
MCD	CdSe^48,49 CdZnSe⁹³	Solid-state NMR	CdSe⁵¹	GPC	InP¹¹	FT-IR	InP⁵⁸ CdSe¹⁴⁴

PLE photoluminescence excitation, MCD magnetic circular dichroism, SCXRD, single-crystal X-ray diffraction, pXRD powder X-ray diffraction, PDF pair distribution function, EXAFS extended X-ray absorption fine structure, XANES X-ray absorption near-edge structure, XPS X-ray photoelectron spectroscopy, NMR nuclear magnetic resonance, MALDI-TOF, matrix-assisted laser desorption/ionization time-of-flight, ESI-MS, electrospray ionization mass spectroscopy, LDI-MS laser desorption/ionization mass spectroscopy, GPC gel-permeation chromatography, TEM transmission electron microscopy, STEM scanning TEM, SAXS small-angle X-ray scattering, FT-IR Fourier-transform infrared spectroscopy, ICP inductively coupled plasma, EDS energy-dispersive spectroscopy, RBS Rutherford backscattering spectroscopy, TGA thermogravimetric analysis, DFT density functional theory.

Search