Fig. 2: Analysis of a 43 nm thick (PED)-CoPi film on FTO deposited from three 600 second chronoamperometric cycles.

a Calculated UV-visible absorptance spectra compared alongside the FTO substrate and a 75 nm thick (AACVD + ET)-CoPi film on FTO, b Top-down and c surface focused higher magnification top-down SEM images, d XRD patterns with reference patterns, e Raman spectrum, and f EDX and XRF atomic % determination (n.d. not determinable).