Fig. 4: Changes in photovoltaic device parameter by mechanical bending test. | npj Flexible Electronics

Fig. 4: Changes in photovoltaic device parameter by mechanical bending test.

From: Flexible kesterite thin-film solar cells under stress

Fig. 4

a, b Rate of change of photovoltaic device parameters with concave (a) and convex (b) bending with a bending radius of 50 mm and a maximum of 1000 bending cycles. Photovoltaic device parameters were measured after 200, 400, 600, 800, and 1000 bending cycles. The inset in (a, b) shows an image of the bent device. c, d Rate of change of series and shunt resistance with concave (c) and convex (d) bending with the same bending condition. Error bars in (a–d) are defined as standard deviation of photovoltaic parameters obtained from four points of two devices.

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