Fig. 4: Influence of Gaussian and top-hat laser profile on sintered trace morphology.
From: Laser sintering of Cu particle-free inks for high-performance printed electronics
a Schematic of laser intensity distribution for Gaussian and top-hat profile and its energy distribution on sintering samples. b Optical inspection of laser sintered sample using a Gaussian profile showing substrate damage (left) and using top-hat profile showing a well sintered Cu metallic layer (right). c SEM image of sintered Cu layer using the continuous spot laser with Gaussian profile near the substrate damage area (red box on the left image of b) showing a non-homogenous sintered structure. d SEM image of sintered Cu layer using the continuous line beam laser with top-hat profile showing a uniform and densely packed Cu microstructure (red box on the right image of b).
