Fig. 4
From: Influence of young cement water on the corrosion of the International Simple Glass
Scanning transmission electron microscopy (STEM), dark-field scanning TEM (DF STEM), secondary electron STEM images and energy-dispersive spectroscopy images of a focused ion beam (FIB) section removed from a monolith of ISG leached for 721 days at 70 °C. Individual STEM-EDX images are provided for Al, C, Ca, K, O, Na, Si and Zr. The middle section of the alteration layer is shown; Band 1 is located closest to (but not in contact with) the bulk glass, and Band 7 is towards (but not in contact with) the solution. Bands 2 and 6 are filled with epoxy resin
