Fig. 6: Ex situ FIB milling showing subsurface IGSCC. | npj Materials Degradation

Fig. 6: Ex situ FIB milling showing subsurface IGSCC.

From: Observation of stress corrosion cracking using real-time in situ high-speed atomic force microscopy and correlative techniques

Fig. 6

(a)–(d) show secondary electron images collected as a part of a series of FIB slices into the area ahead of a crack tip, in the same region as that analysed by APT (a–c) scale bars: 50 µm, (d) scale bar: 10 µm). All images were collected at a tilt of 52° relative to the electron beam. Additional secondary electron images showing intermediate FIB cuts are given in Supplementary Fig. 7.

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