Fig. 2: Circular backscatter electron (CBS) SEM images of AlSi7Mg0.3 surface coated with Zr-CrCC.

a, b Three characteristic regions of coating formation are recognized: above matrix (x3 and x6), above Al-Si IMPs (x4 and x7) and Al-Si-Mg IMPs (x5 and x8). b details area in (a) where all three regions are presented. Squares x3-x9 indicate the areas where EDS analyses were performed with composition in atomic percentages (at.%). The results of EDS analysis are given in Table 1. Green arrows in (a) show cracks in the coating. d The coating thickness was determined between regions x3 and x5 at the interface area. SEM/EDS analyses were conducted at a, b 10 kV, c 5 kV and d 2 kV.