Fig. 6: SEM images and adhesion test of PEHA-SS-coated AlSi7Mg0.3 samples.

a, b Circular backscatter electron (CBS) SEM images of the scribe made at the polyacrylic/siloxane-silica coated-AlSi7Mg0.3 sample. The squares x12 and x13 indicate the areas where the EDS analysis was performed with the composition in atomic percentages (at.%). c, d Confocal microscope images after performing the cross-cut test according to the standard ASTM 3359–2362. SEM/EDS analyses were conducted at 5 kV.