Fig. 1: EBSD characterization of the LT and HT CS Cu. | npj Materials Degradation

Fig. 1: EBSD characterization of the LT and HT CS Cu.

From: Particle-particle interface corrosion of cold sprayed copper in dilute nitric acid solutions: geometry-controlled corrosion mechanism

Fig. 1

a IPFs for LT and HT CS Cu. b CSL boundaries superimposed on IQ maps for LT and HT CS Cu. Green pixels are zero-solution areas where electron diffraction patterns could not be indexed. c The fractions (of length) of the CSL boundaries with Σ values of 3, 9, and ≥11 (top) and the misorientation angle (the lower two) for LT and HT CS Cu.

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