Fig. 2: Electrochemical performance and Equivalent electrical circuits modeling of three Al-Si-Mg alloys. | npj Materials Degradation

Fig. 2: Electrochemical performance and Equivalent electrical circuits modeling of three Al-Si-Mg alloys.

From: Effect of iron and manganese on the corrosion resistance of contaminated secondary Al-Si-Mg cast alloys

Fig. 2: Electrochemical performance and Equivalent electrical circuits modeling of three Al-Si-Mg alloys.

a–c Bode plots of alloys A, B, and C measured after 0.5, 5, and 12 h immersion over a frequency range from 100 kHz to 0.01 Hz. Black, red, and blue curves represent 0.5, 5, and 12 h exposure, respectively. d, e Equivalent electrical circuits used to fit the impedance spectra. Rs denotes solution resistance, Rf surface film resistance, Rct charge-transfer resistance, Qf the constant phase element (CPE) of the passive film, and Qdl the double-layer CPE. f Potentiodynamic polarization curves of alloys A, B, and C. EIS, electrochemical impedance spectroscopy.

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