Fig. 8: Impact of parameter imperfections on CZ gate performance.
The results are shown via (a) fidelity and (b) leakage. The x-axis represents deviations in the coupling strength, measured in units of JCP, while the y-axis corresponds to the ZZ interaction strength, expressed in units of ∣VCP∣. The right panels provide a magnified view of the region near the optimal parameters J = JCP and V = VCP. Owing to the large value of U, variations in J have a more pronounced effect compared to deviations in V. Nevertheless, the impact of both parameters remains within acceptable bounds under typical experimental noise conditions.
