Fig. 2: RIXS intensity distribution maps of CuAl2O4 in the plane of energy loss vs. incident photon energy. | npj Quantum Materials

Fig. 2: RIXS intensity distribution maps of CuAl2O4 in the plane of energy loss vs. incident photon energy.

From: Resonant inelastic X-ray scattering as a probe of Jeff = 1/2 state in 3d transition-metal oxide

Fig. 2

a Cu L-edge XAS spectrum measured with total electron yield. b & c RIXS intensity maps measured around Cu L3 and L2 edges, respectively. The vertical red dashed lines indicate RIXS features from tetrahedral and octahedral Cu2+, corresponding to the absorption energies of the XAS spectrum shown in (a), i.e., 930 & 949.6 eV and 930.8 & 950.2 eV, respectively. All spectra were recorded at room temperature with π-polarized incident X-ray.

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