Fig. 1: Structural and magnetic characterization of MnBi2Te4 thin films.
From: Topological response of the anomalous Hall effect in MnBi2Te4 due to magnetic canting
(a) Crystal structure of MnBi2Te4. Magnetic moments of individual Mn atoms are induced by the black arrows. SL: septuple layer (b) X-ray diffraction patterns taken on samples A (red), B (blue), and C (green). The expected Bragg peaks for MnBi2Te4 and Bi2Te3 are shown below the data. HS stands for heterostructure (of Bi2Te3 and MnBi2T4). c Bright field TEM image of the 24-SL sample A. Red lines are a guide for the eye highlighting the layer stacking. d Magnetization of samples A (red), B (blue) and C (green) versus temperature measured at a magnetic field of B = 3 mT applied along the c axis.
