Fig. 10: Thickness t dependence of the LL fan diagram of the conductivity maximum for the SrRuO3 films. | npj Quantum Materials

Fig. 10: Thickness t dependence of the LL fan diagram of the conductivity maximum for the SrRuO3 films.

From: High-mobility two-dimensional carriers from surface Fermi arcs in magnetic Weyl semimetal films

Fig. 10

a t = 10 nm, b 20 nm, c 40 nm, and d 60 nm. The fixed slopes of the linear fittings are obtained by the frequency F. All plotted data points were used in the linear fittings. \(\gamma + \beta (t)\) is the phase shift in Eq. (4). e Thickness t dependence of the \(\gamma + \beta (t)\). The red line represents the linear fitting. The error bars are defined as the standard deviation of the linear fittings in ad.

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