Fig. 1: SX of rhodamine-6G crystals.
a, Experimental set-up. Top: cartoon showing scanning of a sample plate with XFEL pluses and recording diffraction patterns on a detector. Bottom left: chemical structure of rhodamine-6G. Bottom right: sample plate fixed through a pin onto a sample–pin mounter. b, A typical map of the sample plate showing data-taking positions from rhodamine-6G microcrystals. The smax of the identified diffraction spots per frame is represented by a colour dot. c, Plot of the spot number versus smax = sinθmax/λ, where θmax is the observed highest of half the scattering angle and λ is the wavelength of the X-rays, in one frame. Frames used for indexing are shown in orange. d, Distribution of crystal orientations over the indexed frames, as projections on the x–y (left), x–z (middle) and y–z (right) planes. The incident X-rays are along the y axis. The terminals of a* (a unit vector of the reciprocal lattice) are shown with coloured points. The size of each point and colour represent the number of frames contributing to the corresponding orientation and the averaged smax, respectively.
