Extended Data Fig. 6: SEM and LAADF-STEM images of h-MXenes.

SEM and LAADF-STEM images of a, alkylamine-, b, diamine- and aromatic-amine-modified h-MXenes (scale bar in STEM images is 2 nm). The systematically smaller d-spacings measured from STEM images in comparison with powder X-ray diffraction patterns is attributed to electron beam-induced damage and strain in bended h-MXene stacks used for imaging, as confirmed by cryo-STEM imaging of microtomed h-MXene samples which showed much better agreement of interlayer distances with powder XRD data (Extended Data Fig. 5a–c). c, SEM images of PEG-amine-modified h-MXenes. d, SEM images of Ti3C2(bua)2/3 MXenes prepared with n-BuLi as deprotonating agent. e, STEM-EELS elemental analysis (line scan) of Ti3C2(dda)2/3 MXene.