Fig. 1: Microscopy and particle size distribution of CoOx(OH)y NPs.

a–c, AFM images of CoOx(OH)y NPs deposited on SiO2/Si(100) with average heights of: 8.9 ± 1.5 nm (a); 2.0 ± 0.3 nm (b); particle size distributions extracted from a height analysis of AFM images shown here and in Supplementary Fig. 1 (c). The horizontal scale bars in a and b represent 400 nm. The NP heights reported are the mean of the normal distribution and the error the standard deviation.