Extended Data Fig. 3: TEM images of SW-XPS samples and SW-XPS variation of information depth. | Nature Materials

Extended Data Fig. 3: TEM images of SW-XPS samples and SW-XPS variation of information depth.

From: Tuning electrochemically driven surface transformation in atomically flat LaNiO3 thin films for enhanced water electrolysis

Extended Data Fig. 3: TEM images of SW-XPS samples and SW-XPS variation of information depth.The alternative text for this image may have been generated using AI.

a, and b, Low-resolution high-angle annular dark-field HAADF STEM images of LaNiO3 top layers deposited at 450 °C and 650 °C, respectively. The super lattice was deposited at 550 °C in each case. c, High-resolution image of the super lattice revealing the four-unit-cell periodicity. d,e, The calculated standing-wave profile of electric field intensity (|E2|) as a function of depth and incident angle for the standing wave samples with LaNiO3 top layers deposited at 450 °C and 650 °C, respectively. f,g, Calculated mean information depth as a function of depth and incident angle based on the optimized structure for the standing wave samples with LaNiO3 top layers deposited at 450 °C and 650 °C, respectively (Fig. 2b,c of the main text), derived through multiplication of electric field intensity (|E2|) and photoelectron attenuation. Varying the incident angle changes the information depth deterministically. Simulating all XPS core level rocking curves simultanteously therefore allows to extract the compositional depth profile with atomic layer resolution.

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