Extended Data Fig. 3: 2D-GIWAXS measurement.
From: Highly stretchable organic electrochemical transistors with strain-resistant performance
(a)2D-GIWAXS images and (b)corresponding one-dimensional line-cuts for d- and h-DPP-2T and DPP-g2T films. Solid line: out-of-plane line cuts; dashed line: in-plane line cuts. (c) The Lorentz corrected partial pole figure and (d) calculated relative degree of crystallinity for dense DPP-2T and DPP-g2T films. All films are textured and exhibit similar reflections, demonstrating that porosity does not alter the overall film microstructure and polymer backbone orientation. Thus, distinct (100) and (200) reflections associated with a lamellar d-spacing of 18.9 Å, as well as a (010) reflection due to the backbone π-π stacking measuring 3.7 Å are observed in both out-of-plane and in-plane directions for the h- and d-DPP-2T films. In contrast, only a stronger (100) reflection (d-spacing=19.6 Å) in the in-plane direction and a (010) reflection (π-π stacking distance = 3.9 Å) in the out-of-plane direction are detected for the h- and d-DPP-g2T films. The relative degree of crystallinity for d-DPP-g2T was calculated to be 0.766 ± 0.007 that of d-DPP-2T. These data demonstrate that the DPP-g2T crystallinity is notablely lower than that of DPP-2T, it is less tightly packed, and DPP-g2T backbone is preferentially oriented π-face-on.
