Extended Data Fig. 8: RIXS line scans.
From: Trapped O2 and the origin of voltage fade in layered Li-rich cathodes

RIXS line scans collected at 531.5 eV at different sample locations for the charged samples of (a) 2nd and (b) 100th cycles.
From: Trapped O2 and the origin of voltage fade in layered Li-rich cathodes

RIXS line scans collected at 531.5 eV at different sample locations for the charged samples of (a) 2nd and (b) 100th cycles.