Extended Data Fig. 4: Exemplary 2D classes and exemplary angle measurement under no transcription and transcription conditions.

(a) Representation of 2D classes of the nicked-nanoengine no transcription sample that depict a top view and four more averaged classes with no clearly discernible features of the structures that hindered a clear angle determination. (b) 2D classes of nicked-nanoengine transcription sample with a top view image in the upper left corner and 2D classes where no clear identification of the opening angle was possible. (c) Example of raw data of a TEM image. For angle measurements, only structures that lay on the surface were considered. These were identified based on visibility and correct form of the hinge structures as well as clear visibility of the axial dsDNA patterns in the origami arms. (d) Examples of angle measurements (black).