Extended Data Fig. 3: Atomic force microscopy (AFM) and conductive atomic force microscopy (C-AFM) measurement with DJ phase perovskite films.
From: Linearly programmable two-dimensional halide perovskite memristor arrays for neuromorphic computing
(a) A topological AFM mapping image of the DJ-V-HP/ITO glass structure with gold-coated tip. The tip moves 5 μm through the green dotted line to measure the roughness by distance. (b) C-AFM mapping images of the DJ-V-HP/ITO glass structure with tip biases of 0.05 V. The tip moves through the purple dotted line to measure the current versus the distance. (c) C-AFM mapping images of DJ-V-HP/ITO glass structure with tip biases of 1.5 V. The tip moves through the blue dotted line to measure the current versus the distance. It is noted that the topology mapping and the current mapping were acquired at the same location. (d) A schematic illustration of charged ion migration near the grain boundary in DJ-phase perovskites. The grain boundaries do not hinder the migration of charged ions across the grain, resulting in homogenous ion migration in all regions, regardless of grain boundaries.
