Extended Data Fig. 2: Thickness characterization of atomically thin CrPS4 multilayers.
a, Optical micrographs of CrPS4 multilayers with thicknesses ranging from 2āL to 5āL. b, Raman spectra of CrPS4 multilayers, showing a redshift in the peak near 150ācmā1 as thickness increases, consistent with previously reported thickness-dependent shifts1, 2. c, Extracted optical contrast value of CrPS4 multilayers with thicknesses from 2āL to 5āL. d, Extracted peak positions of the Raman mode around 150ācmā»Ā¹ for multilayers with thicknesses from 2āL to 5āL. These results demonstrate that the layer number of thin CrPS4 can be identified through the redshift in the Raman peak and corresponding changes in optical contrast Source data.
