Extended Data Fig. 1: The scanning transmission electron microscopy (STEM) images of Device 2.
From: Quantized radio-frequency rectification in a kagome superconductor Josephson diode
a-c, The typical STEM images (a and b) and the high angle annular dark field STEM (HAADF-STEM) image (c) captured within the sample present the uniform layered atomic structure of CsV3Sb5. d-f, Distribution maps of each element, Cs (d), V (e) and Sb (f) studied by an energy dispersive X-ray spectroscopy (EDX).
