Extended Data Fig. 2: Ellipsometric data between 4000 and 18000 cm−1.
From: Unconventional free charge in the correlated semimetal Nd2Ir2O7
a, Real and imaginary part of the dielectric function at room temperature measured using spectroscopic ellipsometry at θ = 65 degrees with the surface normal. b, Phase of the normal incidence reflection coefficient using the Fresnel equation \(| {\rm{r}}| {{\rm{e}}}^{{\rm{i}}\phi }=(1-\sqrt{\varepsilon })/(1+\sqrt{\varepsilon })\). c, Absolute square of the reflection coefficient.
