Extended Data Fig. 2: Filtering of the topography.
From: Flat bands in twisted bilayer transition metal dichalcogenides
a, Atomic-resolution STM topography on the 3° tWSe2 sample, with a fixed bias voltage Vbias = −2.5 V and set current I = 100 pA. b, Fourier transform of panel a. c, Filtered Fourier transform, black area at the center indicates the components being removed. d, Topography image after the short-pass filter was applied, white dashed lines indicate the distance between nearest-neighbor AA sites in 3 different directions.
