Fig. 4: Bit-flip code logical performance and dependence on injected errors.

a, Logical error probability for a distance-21 bit-flip code run for 60 cycles, under the effect of either injected leakage (dark circles) or injected Pauli errors (light squares). Three leakage removal strategies, No Reset (red, unfilled), MLR (green, semi-filled) and DQLR (blue, filled), are considered. Lines are fits to experimental data using a power law with an offset. Below, Highlights of fits to experimental data (solid) and numerical simulations (dashed) for the MLR and DQLR strategies. b, Circuits for the bit-flip code, showing the error injection locations for both leakage (left) and Pauli errors (right). Exp., experimental; Sim., simulated.