Extended Data Fig. 1: Scanning electron microscope (SEM) images of device S1, S2, S3 and S4. | Nature Physics

Extended Data Fig. 1: Scanning electron microscope (SEM) images of device S1, S2, S3 and S4.

From: Correlated order at the tipping point in the kagome metal CsV3Sb5

Extended Data Fig. 1: Scanning electron microscope (SEM) images of device S1, S2, S3 and S4.The alternative text for this image may have been generated using AI.

S1 and S4 are membrane devices with reduced differential thermal contraction strain, while S2 is glued down to a sapphire substrate, the coupling between the substrate and sample results in the non-negligible uni-axial strain at low temperature. S3 is a similar device with S2, yet after taking the SEM image, a glue droplet is applied on top of the device to reduce uniaxial strain at low temperature.

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