Extended Data Fig. 3: Grid qubit lifetime measurements.
From: Encoding a qubit in a trapped-ion mechanical oscillator
a–f, States are prepared (left column, \({\left|0\right\rangle }_{L}\); right column, \({\left|+\right\rangle }_{L}\)), and after a variable wait time the state is read out. The resulting measurement data (blue points with s.e.m. error bars) are fitted with an exponential decay Ae−t/T (solid line). For prepared state \({\left|0\right\rangle }_{L}\): a, readout of \({\hat{Z}}_{L}\), from which we find T = 3.7 ± 0.2 ms; c, readout of \({\hat{S}}_{X}\) with T = 0.8 ± 0.1 ms; and e, readout of \({\hat{S}}_{Z}\) with T = 1.1 ± 0.1 ms. For prepared state \({\left|+\right\rangle }_{L}\): b, readout of \({\hat{X}}_{L}\) with T = 3.6 ± 0.3 ms; d, readout of \({\hat{S}}_{X}\) with T = 1.0 ± 0.1 ms; f, readout of \({\hat{S}}_{Z}\) with T = 0.7 ± 0.1 ms.
