Extended Data Fig. 9: Twist-angle measurements using second-harmonic generation.
From: Resonantly hybridized excitons in moiré superlattices in van der Waals heterostructures
a, b, The symbols show the data for the nearly aligned (a) and misaligned (b) samples fabricated from mechanically exfoliated monolayers. Solid lines in the graph represent the fitting of the data with ISHG ∝ sin(3α + ϕ), where α is the rotation angle of the half-wave plate and is φ is a fitting parameter defining the relative orientation of TMD crystal lattices. For full details of the SHG measurements, see Methods.
