Extended Data Fig. 4: Resistance scaling at f = 1 near the critical point.
From: Continuous Mott transition in semiconductor moiré superlattices
a, Temperature dependence of square resistance at varying electric fields in a log–log plot. A power-law dependence \(\propto {T}^{-1.2}\)(dashed line) is observed at the critical electric field. b, Electric-field dependence of \({\rm{\log }}{R}_{{\rm{\square }}}\) at different temperatures. The inflection points are marked by the colour symbols. The inset shows the temperature dependence of the electric field at the inflection point. The data shows that the Widom line is nearly a vertical line in Fig. 3c
