Extended Data Fig. 1: Structure characterization.

a, AFM topography of the surface of our (SrRuO3)11/(PbTiO3)13/(SrRuO3)11 trilayer sample. b, Low-magnification cross-sectional STEM of the sample. The scale bar is 10 nm.

a, AFM topography of the surface of our (SrRuO3)11/(PbTiO3)13/(SrRuO3)11 trilayer sample. b, Low-magnification cross-sectional STEM of the sample. The scale bar is 10 nm.