Extended Data Fig. 2: The Tamlo-R32 mutant displays no yield penalties when grown in the field.
From: Genome-edited powdery mildew resistance in wheat without growth penalties
a–d, The agronomic traits, including grain yield per plant (a), thousand kernel weight (b), tiller number per plant (c) and grain number per spike (d) were evaluated in field conditions in two wheat-growing areas in the North China Plain, Beijing and Zhaoxian in Hebei Province in 2019 and 2020. For box plots, the box limits indicate the twenty-fifth and seventy-fifth percentiles, the whiskers indicate the full range of the data, and the center line indicates the median. Individual data points are plotted. n represents the sample size. Statistical significance was determined by two-tailed Mann-Whitney tests or two-tailed Student’s t-tests. P values are indicated
