Extended Data Fig. 4: X-ray characterization of the doped rubrene thin-film crystals.

(a) Overview of an entire GIWAXS measurement for an orthorhombic platelet film. Structural characterization of thin films. Width of 221-peak from GIWAXS measurements extracted from fit of Gaussian distributions of orthorhombic spherulite (b) and orthorhombic platelet (c) crystals. Inset shows example peak and corresponding fitting. Details regarding the extraction of the peak width are given in the experimental section. The number in round bracket after seed (doping in the seed layer) or bulk (subsequent doping in the bulk film) denotes the doping concentration in wt. % and p/n in square bracket denotes p-type or n-type doping.