Extended Data Fig. 1: Structural analyses for the Mn3Sn stack.
From: Perpendicular full switching of chiral antiferromagnetic order by current
a, Room-temperature spectra obtained by X-ray diffraction (XRD) measurements using the 2θ/ω-scan for the MgO(110)-substrate/W(7 nm)/Mn3Sn(30 nm)/MgO(5 nm) stack (red line) and the substrate (black line). The theoretical spectra for the D019-Mn3Sn and W are presented at the bottom panels. Ta is the post-annealing temperature (Methods). b, XRD patterns of the Φ-scan for the {\(02\bar{2}1\)} planes of the Mn3Sn layer, the {110} planes of the W layer, and the {200} planes of the MgO substrate. c, Surface topography of the MgO(110)-substrate/W(7 nm)/Mn3Sn(30 nm)/MgO(5 nm) stack obtained by atomic force microscopy. The stack has a smooth surface with a root-mean-square (RMS) roughness of 0.6 nm. The scan area is 5 µm × 5 µm. In panels a and b, vertical and horizontal axes are on logarithmic and linear scales, respectively.
