Extended Data Fig. 3: HRTEM and STEM-HAADF imaging of Cu vacancies in interfacial ledges.
From: Dislocation-induced stop-and-go kinetics of interfacial transformations
a, b, HRTEM and HAADF images of the Cu2O(110)/Cu(110) interfaces showing the presence of a double-atomic-height interfacial ledge pinned at the mismatch dislocation core. c, d, HRTEM and HAADF images of the Cu2O(100)/Cu(100) interface showing a monoatomic interfacial ledge pinned at the mismatch dislocation. Shown on the right are the intensity profiles of the Cu2O/Cu interface region marked by the red dashed rectangle in a–d. The yellow arrows mark the interfacial ledges. The relatively dimmed image contrast of the atom column of the interfacial ledges compared to the neighbouring interfacial terrace Cu atom columns indicates the presence of Cu vacancies within the interfacial ledge. Scale bar: 0.5 nm.
