Extended Data Fig. 4: HRTEM and HAADF simulations of interfacial ledges with different length ratios of the Cu and vacancy segments in the ledge.
From: Dislocation-induced stop-and-go kinetics of interfacial transformations
a, b, Cu2O(110)/Cu(110) interface model with LCu/LV = 3 and 1 for the ledge atom columns marked by the cyan and green arrows, respectively, (LCu and LV stand for, respectively, the lengths of the Cu and vacancy segments in the ledge) before a and after b DFT relaxation. c, e, Simulated HRTEM and HAADF-STEM images based on the DFT relaxed interface structure in b. d, f, Intensity profiles drawn from the red rectangles in c and e, respectively. g, h, Cu2O(110)/Cu(110) interface model with LCu/LV = 1 and 1/3 in the two ledge atom columns marked by the green and yellow arrows, respectively, before g and after h DFT relaxation. i, k, Simulated HRTEM and HAADF-STEM images based on the DFT relaxed interface in h. j, l, Intensity profiles drawn from the purple rectangles in i and k, respectively, showing the decreased image intensity with increasing the length of the vacancy segment, consistent with the experimental HRTEM and HAADF images in Extended Data Fig. 3.
