Extended Data Fig. 2: In-situ STEM experiments.
From: In-plane charged domain walls with memristive behaviour in a ferroelectric film
a, STEM image of conductive tungsten probe and of FIB sample lamella. The electrical path is marked with white lines. b, Magnified STEM image of partition area highlighted with a dashed blue square in (a). Capping Pt (blue) and sample (red) are cut out until the partition touches the substrate. c, Magnified STEM image of the tip with a schematic electrical path (red lines), which highlighted by a white square in (a). d, Magnified STEM image of SRO/BFO/SRO structure. e, Related schematic diagram of (d). f, Photograph of Hysitron PI-95 TEM Picoindenter with Electrical Characterization Module (ECM).
