Extended Data Fig. 6: Temperature dependence of buildup.
From: Spin-polarized spatially indirect excitons in a topological insulator
a, The intensity buildup across the various temperature. From left to right, the measurement temperature is 20, 40, 80, 90, 140, and 180 K. The data are taken at the delay times when the bulk states are relaxed for each temperature. b, Temperature dependence of intensity of the buildup. Note the intensity is normalized by the intensity of the proximate TSS. The error bars are estimated by absolute maximum variations of the integration. c, Transient electronic temperature of the intensity buildup for each measurement temperature. The black horizontal line indicates 160 K (~ 14 meV). The error bars are from the uncertainty in the fitting and experimental resolution.
