Extended Data Fig. 7: Region-averaged 4D-STEM NBED patterns of AMC-500 from two different areas, a–c in one area and d–f in the other.
From: Disorder-tuned conductivity in amorphous monolayer carbon
The scanning region of the 4D-STEM dataset is 36 × 36 nm2. Averaged NBED patterns are obtained by dividing the whole scanning regions into 6 × 6 (a,d), 3 × 3 (b,e) and 1 × 1 (c,f) subregions, respectively. Diffuse halos with blurry spots are found as the main features of subregion NBED patterns a and d, showing the intermediate DOD that agrees with the finding from STEM images. The halos become more diffuse when increasing the size of the averaging region from 6 × 6 nm2 (a,d) to 12 × 12 nm2 (b,e) and exhibit no apparent difference with AMC-300 and AMC-400 at the scale of 36 × 36 nm2 (c,f). The results were obtained at room temperature. Scale bars, 5 nm−1 (a–f).
