Extended Data Fig. 10: Electrical measurements of conductive AMC samples.
From: Disorder-tuned conductivity in amorphous monolayer carbon
a–f, Measurements of Rs by the TLM for AMC samples in zones II and IV, showing the temperature-dependent conductivities. Insets, optical images of as-fabricated devices. g, Rs (black circles) as a function of T in one device of AMC in zone IV (550 °C). Inset, natural logarithm of the current as a function of T−1/3. The red lines are the fits to the 2D variable-range-hopping model. h, Results of room-temperature Hall measurements, showing the p-type semiconductor behaviour with a mobility of about 0.1 cm2 V−1 S−1. Inset, optical image of the device with the standard Hall bar configuration. Scale bars, 20 μm (insets of a–f,h).
