Fig. 2: High-resolution characterization of GRX-810 microstructure.
From: A 3D printable alloy designed for extreme environments
a, Scanning transmission electron microscopy–energy dispersive X-ray spectroscopy (STEM–EDS) combined Y and C map showing C segregation at the oxide–matrix interface. b, BF–STEM diffraction contrast image (DCI) micrograph (electron beam is parallel with [001] zone axis of matrix) of dislocation interaction with oxides (black arrows) and the presence of stacking-fault tetrahedra (red arrows). c, STEM–EDS combined W and Re map showing segregation at grain boundary and surrounding the carbide. d, Integrated line scans (at.%), from the rectangle outlined in c, showing segregation of Cr, W and Re and depletion of Co and Ni at the grain boundary. Elements not measuring any change across the boundary are not shown. e, Atomic resolution [011] zone axis HAADF–STEM image of GRX-810 lattice. f, Fast Fourier transformation of the image in e showing the absence of any additional superlattice spots. Both d and e suggest that local chemical ordering is not present.
