Extended Data Fig. 9: Multi-beam simulations.
From: On the origin of diffuse intensities in fcc electron diffraction patterns
Results of the multi-beam simulation for the {220}, {440}, {660}, {880} and {11-1} reflections on the [111] SADP. As shown, the intensities change considerably with sample thickness. The average intensity value over the 0–100 nm thickness range was considered for Extended Data Table 1 and is shown in the figure as a straight line.
