Extended Data Fig. 6: 2D grazing incidence wide-angle X-ray scattering (GIWAXS) measurements.
From: Multifunctional ytterbium oxide buffer for perovskite solar cells
The 2D GIWAXS patterns at an incidence angle of 1.0° for YbOx films prepared on different substrates including silicon (a), glass (b), and ITO-coated glass (c), respectively. The thickness of the deposited YbOx film for this measurement is 10 nm. d, The 2D GIWAXS pattern of the pristine ITO-coated glass.
