Extended Data Fig. 7: XANES/EXAFS analysis of on different Te-TeOx based thin films.
From: Selenium-alloyed tellurium oxide for amorphous p-channel transistors
a. Normalized XANES spectra of the Se-alloyed Te-TeOx (TeOx-TeSe) film at Se K-edge, compared to reference materials of Se and SeO2. b. Corresponding Fourier transform (FT) of Se K-edge k3-weighted EXAFS spectra. c. Comparison of Fourier-transformed features for Te K-edge (black solid line) and Se K-edge (red solid line) EXAFS spectra, compared to those of reference metallic Te and Se powder (dashed line). d. Corresponding Wavelet-transformed k-r space correlations for EXAFS spectra of Se, SeO2, and TeOx-TeSe film, respectively.
